| CLASSIFICATION | Market |
| MANUFACTURING |
obtained by CVD-depositing a film having the thickness of 0.85.+-.5% micrometers on a 6 inches silicon wafer; and has the purity of: Al 98.5%, Si 1%, and Cu 0.5% |
| UPDATE | 07.98 |
| LITERATURE REF. | This data is not available for free |
| MARKETING BY | This data is not available for free |
| PRODUCTION BY | This data is not available for free |
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